Single event effects (SEE) have the potential to adversely affect avionics systems that have not been specifically designed to be resilient to this hazard. There were no specific certification requirements for SEE, and until recently there was no formal guidance material available for addressing SEE during the design process.
The publication of IEC TS 62396 has significantly enhanced understanding and awareness of the issue and ways to address the issue. The proposed changes by the FAA and EASA indicate greater awareness and consideration of SEE during design and certification processes. However, there is still no formal requirement for the consideration of SEE.
In May 2010, the European Aviation Safety Agency (EASA) advised that on recent aircraft certifications (including the A380 and A350), it had requested that the applicant consider the effects of single event upsets (SEUs) and multiple bit upsets (MBUs) on systems and equipment. It also advised that Airbus had required equipment manufacturers to consider the effects of SEU and MBU and to mitigate these effects. As discussed in section 3.6.6, Airbus had included IEC TS 62396 in its requirements for manufacturers since 2007.
In March 2010, the FAA advised that IEC TS 62396 was being considered for inclusion in future Aerospace Recommended Practices (ARPs), as well as FAA Issue Papers and Special Conditions. The FAA also advised that the Aerospace Vehicle Systems Institute (AVSI) helped develop TS 62396, and that one of AVSI’s goals is to encourage the establishment of additional test facilities to enable more cost-effective determination of the SEE immunity of systems or units. Additional facilities would further the understanding of new electronic parts’ susceptibility and for developing regulations and guidance material.
The International Electrotechnical Commission (IEC) published Technical Specification (TS) 62396-1 in 2006 and subsequent parts soon after.
